Daily Papers

We introduce MCUBench, a benchmark featuring over 100 YOLO-based object detection models evaluated on the VOC dataset across seven different MCUs. This benchmark provides detailed data on average precision, latency, RAM, and Flash usage for various input resolutions and YOLO-based one-stage detectors. By conducting a controlled comparison with a fixed training pipeline, we collect comprehensive performance metrics. Our Pareto-optimal analysis shows that integrating modern detection heads and training techniques allows various YOLO architectures, including legacy models like YOLOv3, to achieve a highly efficient tradeoff between mean Average Precision (mAP) and latency. MCUBench serves as a valuable tool for benchmarking the MCU performance of contemporary object detectors and aids in model selection based on specific constraints.

Monocular depth estimation (MDE) plays a crucial role in enabling spatially-aware applications in Ultra-low-power (ULP) Internet-of-Things (IoT) platforms. However, the limited number of parameters of Deep Neural Networks for the MDE task, designed for IoT nodes, results in severe accuracy drops when the sensor data observed in the field shifts significantly from the training dataset. To address this domain shift problem, we present a multi-modal On-Device Learning (ODL) technique, deployed on an IoT device integrating a Greenwaves GAP9 MicroController Unit (MCU), a 80 mW monocular camera and a 8 x 8 pixel depth sensor, consuming approx300mW. In its normal operation, this setup feeds a tiny 107 k-parameter μPyD-Net model with monocular images for inference. The depth sensor, usually deactivated to minimize energy consumption, is only activated alongside the camera to collect pseudo-labels when the system is placed in a new environment. Then, the fine-tuning task is performed entirely on the MCU, using the new data. To optimize our backpropagation-based on-device training, we introduce a novel memory-driven sparse update scheme, which minimizes the fine-tuning memory to 1.2 MB, 2.2x less than a full update, while preserving accuracy (i.e., only 2% and 1.5% drops on the KITTI and NYUv2 datasets). Our in-field tests demonstrate, for the first time, that ODL for MDE can be performed in 17.8 minutes on the IoT node, reducing the root mean squared error from 4.9 to 0.6m with only 3 k self-labeled samples, collected in a real-life deployment scenario.